Browsing School of Microelectronic Engineering (FYP) by Author "Zazurina Abd Rahman"
Now showing items 1-1 of 1
-
The study of the effect of MOS transistor scaling on the critical device parameters
Zazurina Abd Rahman (Universiti Malaysia PerlisSchool of Microelectronic Engineering, 2007-04)Since the invention of transistors some 30 years ago, CMOS devices have been scale down aggressively in each technology generations to achieve higher integration density and performance. The device shrinkage allow denser ...