Browsing School of Microelectronic Engineering (Articles) by Subject "Scanning electron microscope (SEM)"
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The surface morphology characterization of electroless nickel immersion gold under bump metallurgy (UBM) using SEM
(American Institute of Physics, 2007-05-09)This paper presents the surface morphology characterization at each process step in electroless nickel immersion gold (ENIG) deposition using Scanning Electron Microscope (SEM). The characterization start at initial bond ...