Show simple item record

dc.contributor.authorNor Farahidah, Za’bah
dc.date.accessioned2009-08-28T01:41:42Z
dc.date.available2009-08-28T01:41:42Z
dc.date.issued2005-05-18
dc.identifier.citationp.117-121en_US
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/7106
dc.descriptionOrganized by Kolej Universiti Kejuruteraan Utara Malaysia (KUKUM), 18th - 19th May 2005 at Putra Palace Hotel, Kangar.en_US
dc.description.abstractExternal testing of embedded memories by means of an Automated Test Equipment ( ATE ) based test methodology was popular in the early 1990s. However, as memory designs become more complex, the limitations of ATE had raised a need for high quality embedded memory-testing methods. One of these methods is known as Built-in Self Test ( BIST ). This paper provides a comprehensive study of this method using an Electrical Design Automation ( EDA ) tool known as MBISTArchitect. Using this tool, the testing time of using BIST for memories of different types and sizes, and the impact of its circuitry on the area overhead is examined. In addition, using some of its features, the impact on the area overhead by means of adding a diagnostic capability to the BIST circuitry and by using a shared BIST controller for multiple memories is also investigated.en_US
dc.language.isoenen_US
dc.publisherKolej Universiti Kejuruteraan Utara Malaysiaen_US
dc.relation.ispartofseriesProceedings of the 1st National Conference on Electronic Designen_US
dc.subjectEmbedded computer systemsen_US
dc.subjectElectrical Design Automation (EDA)en_US
dc.subjectAutomatic test equipmenten_US
dc.subjectElectronic apparatus and appliances -- Testingen_US
dc.subjectElectronic apparatus and appliances -- Design and constructionen_US
dc.titleThe application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitecten_US
dc.typeWorking Paperen_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record