dc.contributor.author | Vincent, Darin Moreira Anthony | |
dc.contributor.author | Rajamony, Bhuvenesh | |
dc.date.accessioned | 2016-11-30T06:28:53Z | |
dc.date.available | 2016-11-30T06:28:53Z | |
dc.date.issued | 2014 | |
dc.identifier.citation | Advanced Semiconductor Manufacturing Conference (ASMC), 2014, pages 310-314 | en_US |
dc.identifier.isbn | 978-1-4799-4928-1 | |
dc.identifier.uri | http://ieeexplore.ieee.org/document/6847027/?reload=true | |
dc.identifier.uri | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/44226 | |
dc.description | Link to publisher's homepage at http://ieeexplore.ieee.org | en_US |
dc.description.abstract | Semiconductor manufacturing in an Assembly and Test Manufacturing (ATM) environment is becoming more challenging with continuous pressure of lowering overall operating cost and striving for perfect quality in the hope of gaining higher profit margins. One aspect that most semiconductor AT companies focus on is improving the capability and flexibility of the existing equipment to take on new products (without new equipment purchase) while supporting the legacy products without having any quality excursions. The case study presented is on a laser mark tool at Intel Malaysia's ATM site that showcases the ability to improve the overall capability of an existing tool to ensure process robustness and produce quality output by reengineering the process flow execution. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.relation.ispartofseries | Advanced Semiconductor Manufacturing Conference (ASMC); | |
dc.subject | Case study | en_US |
dc.subject | IR laser | en_US |
dc.subject | Quality output | en_US |
dc.subject | TRIZ | en_US |
dc.subject | Laser mark | en_US |
dc.subject | Process Improvement | en_US |
dc.title | Laser marking equipment process $0 cost productivity improvement | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/ASMC.2014.6847027 | |
dc.contributor.url | darin.moreira.anthony.vincent@intel.com | en_US |
dc.contributor.url | bhuvenesh@unimap.edu.my | en_US |