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Technical visit to SIRIM QAS international electrical and electronic testing facilities

dc.contributor.authorAmir Hussein, Jaafar, Ir.
dc.date.accessioned2016-08-14T03:11:22Z
dc.date.available2016-08-14T03:11:22Z
dc.date.issued2016-02
dc.identifier.citationp. 34en_US
dc.identifier.issn0126-9909
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/42486
dc.descriptionLink to publisher’s homepage at http://www.myiem.orgen_US
dc.language.isoenen_US
dc.publisherThe Institution of Engineers, Malaysia (IEM)en_US
dc.relation.ispartofseriesJurutera;2016 (2)
dc.subjectEngineers -- Bulletinen_US
dc.subjectIEM bulletinen_US
dc.subjectSIRIM QASen_US
dc.subjectTechnical visiten_US
dc.subjectElectrical and electronic testing facilitiesen_US
dc.titleTechnical visit to SIRIM QAS international electrical and electronic testing facilitiesen_US
dc.typeArticleen_US


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