dc.contributor.author | Lim Yee, Chew | |
dc.date.accessioned | 2016-03-07T01:49:54Z | |
dc.date.available | 2016-03-07T01:49:54Z | |
dc.date.issued | 2010-04 | |
dc.identifier.uri | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/40982 | |
dc.description | Access is limited to UniMAP community. | en_US |
dc.description.abstract | This study concerns the Test Probes a semiconductor manufacturing process
improvement. It is learned through the process flow and by collecting the required
process time of the production line, then determined the causes and effects of running
long production cycle times which widely vary and the cumulative impact on operating
results are nearly incalculable. Identifying and correcting the root cause impediments
are needed to be done in order to achieve significant improvements in production
performance. So that the non-value added activities or time should be found by using
the Lean Elements. Therefore, a lean technique, 5 S is used to reduce the processes
cycle-time and increase the productivity in production line. 5 S is a combination of 5
items which are Sort, Sort in order, Shine, Standardizing and Self-discipline. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Universiti Malaysia Perlis (UniMAP) | en_US |
dc.subject | Cycle time | en_US |
dc.subject | Semiconductor -- Manufacturing process | en_US |
dc.subject | Production cycle time | en_US |
dc.subject | Cycle time improvement | en_US |
dc.title | Reducing cycle time in semiconductor manufacturing process | en_US |
dc.type | Learning Object | en_US |
dc.contributor.advisor | Dr Muhammad Iqbal Muhammad Hussain | en_US |
dc.publisher.department | School of Manufacturing Engineering | en_US |