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dc.contributor.authorGoh, Teck Joo
dc.contributor.authorChu, Chia Pin
dc.contributor.authorSeetharamu, Kankanhally N.
dc.contributor.authorGhulam, Abdul Quadir, Prof. Dr.
dc.contributor.authorZainal Alimuddin, Zainal Alauddin, Dr.
dc.date.accessioned2014-04-21T06:41:53Z
dc.date.available2014-04-21T06:41:53Z
dc.date.issued2003
dc.identifier.citationAdvances in Electronic Packaging, vol. 2, 2003, pages 323-330en_US
dc.identifier.isbn0-7918-3690-8
dc.identifier.isbn0-7918-3674-6 (elSBN)
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/33881
dc.descriptionLink to publisher's homepage at http://asmedigitalcollection.asme.org/en_US
dc.description.abstractThis paper reviews the design of a flip chip thermal test vehicle. Design requirements for different applications such as thermal characterization, assembly process optimization, and product burn-in simulation are outlined. The design processes of different thermal test chip structures including the temperature sensor and passive heaters are described in detail. In addition, the design of fireball heater, a novel test chip structure used for evaluating the effectiveness of heat spreading of advanced thermal solutions, is also illustrated. The design considerations and processes of the package substrate and printed circuit board with special emphasis on the physical routing of the thermal test chip structures are described. These design processes are supported with thermal data from various finite-element analyses (FEA) carried out to evaluate the capability and limitations of thermal test vehicle design. Design optimization as the outcome of these analyses is also elaborated. Lastly, the validation and calibration procedures of the thermal test vehicle are presented in this paper.en_US
dc.language.isoenen_US
dc.publisherASMEen_US
dc.subjectAnd finite-element analysisen_US
dc.subjectFlip chip thermal test vehicleen_US
dc.subjectThermal characterizationen_US
dc.titleFlip chip thermal test vehicle design: Requirements, evaluations, and validationsen_US
dc.typeWorking Paperen_US
dc.identifier.urlhttp://proceedings.asmedigitalcollection.asme.org/proceeding.aspx?articleid=1579467
dc.identifier.url10.1115/IPACK2003-35142
dc.contributor.urlknseetharamu@hotmail.comen_US
dc.contributor.urlgaquadir@unimap.edu.myen_US


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