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dc.contributor.authorAhmed, Naser M.
dc.contributor.authorYarub, Al-Douri, Assoc. Prof. Dr.
dc.contributor.authorAlwan, Alwan M.
dc.contributor.authorJabbar, Allaa A.
dc.contributor.authorArif, Ghassan E.
dc.date.accessioned2013-07-23T07:08:39Z
dc.date.available2013-07-23T07:08:39Z
dc.date.issued2012-11-20
dc.identifier.citationp.157-161en_US
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/26995
dc.descriptionMalaysian Technical Universities Conference on Engineering and Technology (MUCET) 2012 organised by technical universities under the Malaysian Technical Universities Network (MTUN), 20th - 21st November 2012 at Hotel Seri Malaysia, Kangar, Perlis.en_US
dc.description.abstractWe prepared nanostructures silicon photodiode (nPSi) by using laser assisted etching at fixed current density (30 mA/cm2) with different etching wavelengths of laser diode (532,650 and 810 nm), a (metal/nanostructure silicon/metal) photodiode has been fabricated from rapid thermal oxidation (RTO) and rapid thermal annealing (RTA) processes to improve the characterizations of PSi photodiode, A responsivity of (3A/w) was measured at (450 nm) with low value of dark current (1.33 μA/cm) and higher value of photo current (610 μA/cm2) at 5 volt reverse bias. The results show that the wavelength IR (810 nm) give us the best photodiode and electrical characteristics.en_US
dc.language.isoenen_US
dc.publisherMalaysian Technical Universities Network (MTUN)en_US
dc.subjectNanostructures silicon photodiode (nPSi)en_US
dc.subjectPhotodiodeen_US
dc.titleCharacteristics of nanostructure silicon photodiode using laser assisted etchingen_US
dc.typeWorking Paperen_US
dc.contributor.urlyarub@unimap.edu.myen_US
dc.contributor.urlghasanarif@yahoo.comen_US


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