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dc.contributor.authorHyukjoon, Kwoon
dc.contributor.authorYoungshin, Kim
dc.contributor.authorJuneho, Yi
dc.date.accessioned2012-10-15T00:55:31Z
dc.date.available2012-10-15T00:55:31Z
dc.date.issued2012-02-27
dc.identifier.citationp. 267-271en_US
dc.identifier.isbn978-145771989-9
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6179018
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/21350
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.org/en_US
dc.description.abstractRecently reported Relevant Neighbor Area (RNA) methods for projection image inpainting have achieved a drastic improvement in reducing inpainting errors simply by excluding irrelevant neighbor pixels in computing an inpainting value. This research presents how to design more accurate RNA masks in order to further improve the inpainting performance of current RNA masks. We employ the Intersection of Confidence Intervals (ICI) rule that provides spatially adaptive window size for optimal signal estimation in the presence of noise. In our case, it allows us to eliminate outlier pixels in RNA that degrades the inpainting performance, yielding an optimal RNA mask. Since the ICI rule gives an optimal neighbor area, we are free from the difficult problem of deciding the size of neighbor area for inpainting. Experimental results show that inpainting methods using more accurately determined RNA masks significantly outperform the methods that employ the current RNA masks.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofseriesProceedings of the International Conference on Biomedical Engineering (ICoBE 2012)en_US
dc.subjectComponenten_US
dc.subjectMetal artifacts reduction (MAR)en_US
dc.subjectX-ray CT imagesen_US
dc.subjectProjection image inpaintingen_US
dc.subjectRelevant neighbor area (RNA)en_US
dc.subjectIntersection of confidence intervals (ICI)en_US
dc.titleProjection image inpainting in X-ray CT using Relevant Neighbor Area (RNA) and Intersection of Confidence Intervals (ICI)en_US
dc.typeWorking Paperen_US
dc.contributor.urllunlun@skku.eduen_US
dc.contributor.urlkarisdo@ece.skku.ac.kren_US
dc.contributor.urljhyi@skku.eduen_US


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