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dc.contributor.authorKhiang, Lee Soo
dc.contributor.authorNorhawati, Ahmad
dc.contributor.authorMuammar, Mohamad Isa
dc.contributor.authorRosidah, Alias
dc.date.accessioned2012-07-09T09:21:42Z
dc.date.available2012-07-09T09:21:42Z
dc.date.issued2008-12-01
dc.identifier.citationp. 1-7en_US
dc.identifier.isbn978-142442315-6
dc.identifier.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4786684
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/20231
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.org/en_US
dc.description.abstractMetallization provides electrical routing and serves as thermal via in LTCC (Low Temperature Cofired Ceramic) technology. High electrical and thermal conductivity is desirable. It is often achieved with the use of low electrical resistance materials, such as gold, silver and copper. The conductive paste made of these materials is expensive. Hence, the fabrication of LTCC has to be performance-wise and cost effective. The width, length and thickness of metallization are associated with the amount of conductor paste used. The thickness of metallization governs the functionality and performance of some components, such as resistor. In this paper, the physical attributes of LTCC substrate and its metallization was studied. Due to the constraint brought by the physical attributes of LTCC samples, various methods had been carried out. This paper also summarized the pros and cons of each method. The methods are limited to the equipment available.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.ispartofseriesProceedings of the International Conference on Electronic Design (ICED) 2008en_US
dc.subjectConductive pastesen_US
dc.subjectConductor pastesen_US
dc.subjectCost effectivesen_US
dc.subjectElectrical resistancesen_US
dc.subjectLTCC (low temperature co fired ceramic)en_US
dc.subjectLTCC substratesen_US
dc.subjectMetallizationen_US
dc.titleMethods of measurement of LTCC metallization thicknessen_US
dc.typeWorking Paperen_US
dc.contributor.urlnorhawati@unimap.edu.myen_US
dc.contributor.urlmuammar@unimap.edu.myen_US


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