dc.contributor.author | Md. Anwarul, Abedin | |
dc.contributor.author | M. M., Shahidul Hassan | |
dc.date.accessioned | 2011-08-12T05:39:11Z | |
dc.date.available | 2011-08-12T05:39:11Z | |
dc.date.issued | 2005-09 | |
dc.identifier.citation | The Journal of the Institution of Engineers, Malaysia, vol. 66(3), 2005, pages 42-46 | en_US |
dc.identifier.issn | 0126-513X | |
dc.identifier.uri | http://www.myiem.org.my/content/iem_journal_2005-176.aspx | |
dc.identifier.uri | http://dspace.unimap.edu.my/123456789/13544 | |
dc.description | Link to publisher's homepage at http://www.myiem.org.my/ | en_US |
dc.description.abstract | In this paper analytical expressions of effective base width and base transit time for uniformly doped base of bipolar junction
transistors (BJT) are developed taking Kirk effect into consideration. Modern bipolar junction transistors tend to operate with
saturated carrier velocity in the collector space-charge region, and therefore we have incorporated this effect in the present
work. Physical analysis of Kirk effect shows that the base transit time increases significantly when the base width widening
or when Kirk effect is considered. | en_US |
dc.language.iso | en | en_US |
dc.publisher | The Institution of Engineers, Malaysia | en_US |
dc.subject | Bipolar junction transistors (BJT) | en_US |
dc.subject | Base transit time | en_US |
dc.subject | Effective Base Width | en_US |
dc.subject | Kirk effect | en_US |
dc.title | Analytical base transit time model of uniformly doped base bipolar transistors considering Kirk effect | en_US |
dc.type | Article | en_US |