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dc.contributor.authorMd. Anwarul, Abedin
dc.contributor.authorM. M., Shahidul Hassan
dc.date.accessioned2011-08-12T05:39:11Z
dc.date.available2011-08-12T05:39:11Z
dc.date.issued2005-09
dc.identifier.citationThe Journal of the Institution of Engineers, Malaysia, vol. 66(3), 2005, pages 42-46en_US
dc.identifier.issn0126-513X
dc.identifier.urihttp://www.myiem.org.my/content/iem_journal_2005-176.aspx
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/13544
dc.descriptionLink to publisher's homepage at http://www.myiem.org.my/en_US
dc.description.abstractIn this paper analytical expressions of effective base width and base transit time for uniformly doped base of bipolar junction transistors (BJT) are developed taking Kirk effect into consideration. Modern bipolar junction transistors tend to operate with saturated carrier velocity in the collector space-charge region, and therefore we have incorporated this effect in the present work. Physical analysis of Kirk effect shows that the base transit time increases significantly when the base width widening or when Kirk effect is considered.en_US
dc.language.isoenen_US
dc.publisherThe Institution of Engineers, Malaysiaen_US
dc.subjectBipolar junction transistors (BJT)en_US
dc.subjectBase transit timeen_US
dc.subjectEffective Base Widthen_US
dc.subjectKirk effecten_US
dc.titleAnalytical base transit time model of uniformly doped base bipolar transistors considering Kirk effecten_US
dc.typeArticleen_US


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