Browsing The Library by Subject "X- ray diffraction (XRD)"

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    • Effect of thermal processes on Al thin film in the present of nitrogen (N2) gas 

      Riyaz Ahmad, Mohamed Ali; Ahmad Nasrull, Mohamed; Nafarizal, Nayan (Universiti Malaysia Pahang, 2009-06-20)
      The morphology evolution of aluminum (Al) thin film in the present of Nitrogen (N2) gas has been studied. The Al thin film has been fabricated on silicon (Si) substrate using aluminum evaporation system. Then, the ...