Browsing The Library by Subject "Automatic test equipment"
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The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect
(Kolej Universiti Kejuruteraan Utara Malaysia, 2005-05-18)External testing of embedded memories by means of an Automated Test Equipment ( ATE ) based test methodology was popular in the early 1990s. However, as memory designs become more complex, the limitations of ATE had raised ...