Search
Now showing items 1-1 of 1
CdS film thickness characterization by R.F. magnetron sputtering
(American Institute of Physics, 2009-06-01)
In this work, cadmium sulphide (CdS) target with 99.999% purity was used as a target in RF magnetron sputtering. The sputtering experiment was conducted onto silicon oxide substrates at different temperatures ranging from ...