Browsing School of Manufacturing Engineering (FYP) by Subject "Scanning Electron Microscope (SEM)"

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    • The effect of material properties variation on clipper cutter life 

      Tan Hui, Wen (Universiti Malaysia Perlis (UniMAP)School of Manufacturing Engineering, 2010-04)
      The effect of material properties variation on clipper cutter life onto the cutter that provided by the Covidien Company were evaluated and compared. The material and mechanical properties of the Sample A, Sample B and ...