Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/76070
Title: Electroencephalogram (EEG)-based systems to monitor driver fatigue: a review
Authors: Muhammad Shafiq, Ibrahim
Seri Rahayu, Kamat
Syamimi, Shamsuddin
Fakulti Kejuruteraan Pembuatan, Universiti Teknikal Malaysia Melaka (UTeM)
Work-Related Road Safety Management Cluster, Malaysian Institute of Road Safety Research (MIROS)
Information Science and Intelligent Systems, Tokushima University
seri@utem.edu.my
Issue Date: Mar-2022
Publisher: Universiti Malaysia Perlis (UniMAP)
Citation: International Journal of Nanoelectronics and Materials, vol.15 (Special Issue), 2022, pages 365-380
Series/Report no.: Special Issue ISSTE 2022;
Abstract: An efficient system that is capable to detect driver fatigue is urgently needed to help avoid road crashes. Recently, there has been an increase of interest in the application of electroencephalogram (EEG) to detect driver fatigue. Feature extraction and signal classification are the most critical steps in the EEG signal analysis. A reliable method for feature extraction is important to obtain robust signal classification. Meanwhile, a robust algorithm for signal classification will accurately classify the feature to a particular class. This paper concisely reviews the pros and cons of the existing techniques for feature extraction and signal classification and its fatigue detection accuracy performance. The integration of combined entropy (feature extraction) with support vector machine (SVM) and random forest (classifier) gives the best fatigue detection accuracy of 98.7% and 97.5% respectively. The outcomes from this study will guide future researchers in choosing a suitable technique for feature extraction and signal classification for EEG data processing and shed light on directions for future research and development of driver fatigue countermeasures.
Description: Link to publisher's homepage at http://ijneam.unimap.edu.my
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/76070
ISSN: 2232-1535 (online)
1985-5761 (Printed)
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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