Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/75995
Title: A study on heavy vehicle visibility and crash analysis using ANSYS
Authors: Uvaaraj, Jagatheesvaran
Shamsul Anuar, Shamsudin
Norasra, A. Rahman
Syed Najib, Syed Salim
Shahrudin, Zakaria
Zairulazha, Zainal
Safarudin Gazali, Herawan
Huthaifa Ahmad, Al_Issa
Fakulti Kejuruteraan Mekanikal, Universiti Teknikal Malaysia Melaka (UTeM)
Fakulti Teknologi Kejuruteraan Elektrik dan Elektronik, Universiti Teknikal Malaysia Melaka (UTeM)
Faculty of Engineering, Bina Nusantara University
Electrical and Electronics Engineering Department, Al Balqa Applied University
shamanuar@utem.edu.my
Issue Date: Mar-2022
Publisher: Universiti Malaysia Perlis (UniMAP)
Citation: International Journal of Nanoelectronics and Materials, vol.15 (Special Issue), 2022, pages 299-312
Series/Report no.: Special Issue ISSTE 2022;
Abstract: A pilot study was conducted to evaluate the visibility of heavy truck in Malaysia. A survey, analytical computations, and computer simulations were all part of the investigation scope. The survey was conducted with 40 respondents to investigate the visibility detection of heavy vehicles, which considered lights, light reflective stickers, and the color of canvas used on heavy vehicles. Another concern is the poor speed of heavy vehicles when climbing up hills with heavy loads, which is a hazard since being too slow may produce a more severe rearend collision damage. Additionally, computer impact analyses were also done by using ANSYS, where many rear-end crashes between a car and a heavy vehicle were analyzed. Hence, a conclusion may be formed that the slower the speed of a heavy vehicle, the higher the impact experienced by the car colliding from behind the heavy vehicle
Description: Link to publisher's homepage at http://ijneam.unimap.edu.my
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/75995
ISSN: 1997-4434 (Online)
1985-5761 (Printed)
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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