Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/74956
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dc.contributor.authorKaiswariah, Magiswaran-
dc.contributor.authorMohd Natashah, Norizan-
dc.contributor.authorIli Salwani, Mohamad-
dc.contributor.authorNorsuria, Mahmed-
dc.contributor.authorSiti Norhafizah, Idris-
dc.contributor.authorSharizal, Ahmad Sobri-
dc.date.accessioned2022-04-14T03:14:01Z-
dc.date.available2022-04-14T03:14:01Z-
dc.date.issued2021-12-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.14 (Special Issue), 2021, pages 59-66en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/74956-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.myen_US
dc.description.abstractDye-sensitized solar cell (DSSC) has been studied widely due to its efficiency and the simplicity of manufacturing technology. Much research has been performed to improve the photovoltaic output parameters in DSSC by modifying the photoanode layers. The efforts to investigate DSSC mainly focus on how to increase light absorption, speed electron transport in circuits, and reduce charge recombination. This review discusses the process of charge recombination and the paths of occurrence in a DSSC. Recombination occurs when the electrons in the conduction band fall into the valance band holes and is considered an unnecessary process in DSSC. Due to the recombination process, the photocurrent and the photovoltage are reduced, leading to lower power conversion efficiency. Hence, the ways to overcome the charge recombination process were also discussed.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subject.otherCharge recombinationen_US
dc.subject.otherDye-sensitized solar cell (DSSC)en_US
dc.subject.otherDoped ZnO photoanodeen_US
dc.titleCharge recombination in zinc oxide-based dye-sensitized solar cell: a mini reviewen_US
dc.typeArticleen_US
dc.identifier.urlhttp://ijneam.unimap.edu.my-
dc.contributor.urlmohdnatashah@unimap.edu.myen_US
dc.contributor.urlnorsuria@unimap.edu.myen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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