Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/7362
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dc.contributor.authorZulkifli, Husin-
dc.contributor.authorAbdul Hallis, Abdul Aziz-
dc.contributor.authorR. Badlishah, Ahmad-
dc.date.accessioned2009-12-01T03:05:04Z-
dc.date.available2009-12-01T03:05:04Z-
dc.date.issued2008-12-01-
dc.identifier.citationp.1-4en_US
dc.identifier.isbn978-1-4244-2315-6-
dc.identifier.urihttp://ieeexplore.ieee.org/xpls/abs_all.jsp?=&arnumber=4786768-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/7362-
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.orgen_US
dc.description.abstractFruit maturity classification is hard to determine. This is certainly true, for some fruits whose color have no direct correlation with its level of maturity or ripeness. The levels of maturity can be determined by human expert, however for larger quantity inspection, this method is beyond practical. Therefore, accurate automatic classification for fruit maturity may be advantageous for the agriculture industry. In addition, consumers in supermarkets may also benefit from this system. This paper describes variant methods used for this purpose and the method which is proposed to enhance the measuring techniques. Feasibility study been conducted for nondestructive fruit maturity classifier system based on capacitive properties measurement methods using parallel-plate capacitor. This method is used to determine different levels of fruit maturity using dielectrics of banana hence it is suitable for this measuring technique because it does not destroy the texture and the nutrient of fruit.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineering (IEEE)en_US
dc.relation.ispartofseriesInternational Conference on Electronic Design (ICED 2008)en_US
dc.subjectCapacitive and maturityen_US
dc.subjectDielectricen_US
dc.subjectAgricultural productsen_US
dc.subjectCapacitance measurementen_US
dc.subjectNondestructive testingen_US
dc.subjectVoltage measurementen_US
dc.subjectFruit maturityen_US
dc.titleFeasibility study of a non-destructive fruit maturity testing system on banana utilizing capacitive propertiesen_US
dc.typeArticleen_US
dc.contributor.urlzulhusin@unimap.edu.myen_US
Appears in Collections:Conference Papers
R. Badlishah Ahmad, Prof. Ir. Ts. Dr.

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