The application of Built-in Self Test (BIST) for embedded memory testing via MBISTArchitect

Abstract

External testing of embedded memories by means of an Automated Test Equipment ( ATE ) based test methodology was popular in the early 1990s. However, as memory designs become more complex, the limitations of ATE had raised a need for high quality embedded memory-testing methods. One of these methods is known as Built-in Self Test ( BIST ). This paper provides a comprehensive study of this method using an Electrical Design Automation ( EDA ) tool known as MBISTArchitect. Using this tool, the testing time of using BIST for memories of different types and sizes, and the impact of its circuitry on the area overhead is examined. In addition, using some of its features, the impact on the area overhead by means of adding a diagnostic capability to the BIST circuitry and by using a shared BIST controller for multiple memories is also investigated.