Please use this identifier to cite or link to this item:
http://dspace.unimap.edu.my:80/xmlui/handle/123456789/6990
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Retnasamy, V. | - |
dc.contributor.author | Mani Maran, Ratnam | - |
dc.contributor.author | Sundaraj, Kenneth | - |
dc.contributor.author | Zaliman, Sauli | - |
dc.date.accessioned | 2009-08-21T03:18:43Z | - |
dc.date.available | 2009-08-21T03:18:43Z | - |
dc.date.issued | 2007 | - |
dc.identifier.citation | p.264-269 | en_US |
dc.identifier.isbn | 978-0-88986-656-0 | - |
dc.identifier.uri | https://www.actapress.com/Content_Of_Proceeding.aspx?ProceedingID=435#codes | - |
dc.identifier.uri | http://dspace.unimap.edu.my/123456789/6990 | - |
dc.description | Link to publisher's homepage at http://www.iasted.org/ | en_US |
dc.description.abstract | AVI's are playing important roles in quality inspection in the electronic industry. Most existing AVIs are single overhead camera and are incapable detecting 3D defects. This work presents solving the shortcoming stated using an angle fringe projection. This work was done using a noncollimated light source, whereas other researches on surface metrology usually used collimated light source. For precise surface or height measurements collimated light or laser source is commonly used. , this work has demonstrated a successful manipulation of the non-collimated light source in height measurement by calibration of the illumination angle and development of the reference table. | en_US |
dc.language.iso | en | en_US |
dc.publisher | International Association of Science and Technology for Development (IASTED)/ACTA Press | en_US |
dc.relation.ispartofseries | Proceedings of the 3rd IASTED International Conference on Advances in Computer Science and Technology (ACST 2007) | en_US |
dc.subject | Automated | en_US |
dc.subject | Fringe | en_US |
dc.subject | Inspection | en_US |
dc.subject | Non-collimated lighting | en_US |
dc.subject | Projection | en_US |
dc.subject | Visual | en_US |
dc.subject | Image processing | en_US |
dc.title | Tilt detection of connectors using phase shifting | en_US |
dc.type | Article | en_US |
Appears in Collections: | School of Mechatronic Engineering (Articles) Kenneth Sundaraj, Assoc. Prof. Dr. |
Files in This Item:
File | Description | Size | Format | |
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Abstract.pdf | 7.54 kB | Adobe PDF | View/Open |
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