Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/68822
Title: The effect of temperature on the electrical conductivity and microstructure behaviour of silver particles
Authors: A. M., Yunos
G., Omar
M. A, Salim
N. A., Masripan
Mohammed Hussin Ahmed Al-Mola
ghazali@utem.edu.my
Keywords: Silver conductive ink
Temperature
Conductivity
Microstructure behaviour
Issue Date: May-2020
Publisher: Universiti Malaysia Perlis (UniMAP)
Citation: International Journal of Nanoelectronics and Materials, vol.13(Special Issue), 2020, pages 431-438
Series/Report no.: International Symposium on Science, Technology and Engineering (ISSTE 2019);
Abstract: Silver conductive ink has been used in the electronics industry due to their potential advantages such as high electrical conductivity and thermal conductivity. However, silver needs to undergo a curing process to reduce the porosity between particles as well as to have a smooth conductive track to ensure maximum conductivity. Therefore, the effect of temperature on the electrical conductivity and microstructure were explored. The printing of silver conductive paste was executed on a polymer substrate through screen printing before analysis. Next, an electrical analysis was done to measure the conductivity by using a 4-point probes instrument, followed with microstructure and mechanical analysis which were carried out to observe the structure behaviour and hardness of silver respectively with respect to temperature. The study found that the electrical conductivity of silver increases when temperature elevated. Besides that, the microstructure of silver has a larger size with the increase in temperature, correspondingly cause the silver to have less hardness. In conclusion, temperature plays significant roles in increasing the electrical conductivity of silver.
Description: Link to publisher's homepage at http://ijneam.unimap.edu.my
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/68822
ISSN: 1985-5761 (Printed)
1997-4434 (Online)
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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