Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/67711
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dc.contributor.authorZiad, T. Khodiar-
dc.contributor.authorNadir, F. Habubi-
dc.contributor.authorIntessar, K. Abd-
dc.contributor.authorAhmed, M. Shano-
dc.date.accessioned2020-09-28T02:59:24Z-
dc.date.available2020-09-28T02:59:24Z-
dc.date.issued2020-07-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.13(3), 2020, pages 433-444en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/67711-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.myen_US
dc.description.abstractIn this study, the sol-gel process has been adopted for the synthesis of Cu1-xAlxO nanostructures (0≤ x ≤ 0.90, in steps of 0.10). The system revealed pure CuO phase with monoclinic structure. Al2O3 phase and copper oxide (Cu2O) were developed at higher substituent concentrations till x=0.40. Structural properties were studied by X-ray diffraction (XRD) and morphological properties by Scanning Electron Microscope (SEM). Average crystallite size from the range of 12.65 nm to 22.9 nm was calculated by Scherer formula. The SEM images indicated that the Cu1-xAlxO possessed nanoparticles like structure, i.e. it contained some pores or voids and vacancies caused by a difference in experimental conditions. Results of EDX revealed the presence of Aluminum (Al), oxygen (O) and copper (Cu) elements in Cu1-xAlxO and the data showed that the nanoparticles were nearly stoichiometric.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subjectCu1-xAlxOen_US
dc.subjectSol-gel methoden_US
dc.subjectStructural propertiesen_US
dc.titleStructural and morphological properties of Cu1-xAlxO nanostructures prepared by sol-gel methoden_US
dc.typeArticleen_US
dc.identifier.urlhttp://ijneam.unimap.edu.my-
dc.contributor.urlnadirfadhil@uomustansiriyah.edu.iqen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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