Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/61124
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dc.contributor.authorAmara, Z.-
dc.contributor.authorKhadraoui, M.-
dc.contributor.authorMiloua, R.-
dc.date.accessioned2019-08-01T08:41:16Z-
dc.date.available2019-08-01T08:41:16Z-
dc.date.issued2019-07-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.12(3), 2019, pages 363-374en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/61124-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.myen_US
dc.description.abstractγ-MnS thin films were prepared on glass substrate by spray pyrolysis method at 280 °C. The optical constants and thickness of the films were extracted using the pattern search optimization technique in combination with a seed preprocessing procedure (spPS). Refractive index dispersion of the films was analyzed by using the concept of the single oscillator model. The values of the oscillator energy, E0, and the dispersion energy, Ed, were determined as 8.83 eV and 5.65 eV, respectively. The analysis of the optical properties of the γ-MnS film showed a direct transition with energy band gap of 2.74 eV. Utilizing Hall Effect measurement, we have determined values of the resistivity ρ which equals to 1150 Ωcm. The positive value of hall coefficient showed a p-type in nature of the obtained thin film. The maximum of photocurrent density estimated by Yablonovitch limit is equal to 46 mA/cm2.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subjectγ-MnSen_US
dc.subjectThin filmen_US
dc.subjectOptical propertiesen_US
dc.subjectSingle-Oscillator modelen_US
dc.subjectHall effect measurement.en_US
dc.titleOptical, electrical and photovoltaic studies of γ-MnS thin films deposited by spray pyrolysis techniqueen_US
dc.typeArticleen_US
dc.contributor.urlamarazeyneb1991@gmail.comen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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