Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/57732
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dc.contributor.authorFoo, Kui Law-
dc.contributor.authorMohammad Rakib, Uddin-
dc.contributor.authorNur Musyiirah, Haji Masri-
dc.date.accessioned2018-12-25T06:12:33Z-
dc.date.available2018-12-25T06:12:33Z-
dc.date.issued2018-10-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.11(4), 2018, pages 499-516en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/57732-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.myen_US
dc.description.abstractThis paper provides the analysis of a silicon P-I-N waveguide. The analysis is performed by simulating the said waveguide by applying the electro-optic carrier-depletion effect. Three design parameters have been altered, namely the rib waveguide dimensions, the doping concentration and the electrical contacts distance to the waveguide. The simulation generates the free carrier concentration around a specific region of the waveguide and the waveguide effective index change in response to the voltage applied.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subjectPIN Si Waveguideen_US
dc.subjectElectro-Opticen_US
dc.subjectCarrier depletionen_US
dc.titleSimulation and Analysis of a Silicon P-I-N Waveguide Based on Electro-Optic Carrier-Depletion Effecten_US
dc.typeArticleen_US
dc.identifier.urlhttp://ijneam.unimap.edu.my-
dc.contributor.urlp20171002@student.utb.edu.bnen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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