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dc.contributor.authorAhmed, Hisham M.-
dc.contributor.authorAbdul Razzaq, Mohammed J.-
dc.contributor.authorAbass, Abdulla. K.-
dc.date.accessioned2018-12-25T06:10:08Z-
dc.date.available2018-12-25T06:10:08Z-
dc.date.issued2018-10-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.11(4), 2018, pages 473-480en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/57728-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.myen_US
dc.description.abstractIn this work, a numerical analysis based on finite element method (FEM) has been used to predict both the temperature distribution and focal length in CW Nd:YAG laser rod. The double end-pumped utilizing two different pumping profiles, namely, Gaussian and super- Gaussian beam profiles are adopted in this simulation. In addition, four different super- Gaussian beam profiles (N = 4, 6, 10, 30) have been studied and compared with the Gaussian (N = 2) pump profile. At Gaussian pumping power of 40 W (20 W for each face), maximum center temperature is observed for each face of the two end-pumped faces were found, and start to decrease in the super-Gaussian case as the exponent factor N increases. The thermal lensing effect strongly depends on different factors, namely, power of the pump source, and distribution profile of the pump through the laser medium geometry. Therefore, the double-end-pumped method may be considered as important to reduce temperature gradiant in the laser rod while choosing the type of pumping profiles.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subjectThermal Lens Effectsen_US
dc.subjectFinite Element Method (FEM)en_US
dc.subjectEnd-Pumping Geometryen_US
dc.subjectSuper-Gaussian Pumping Profileen_US
dc.titleNumerical Thermal Model of Diode Double-End-Pumped Solid State Lasersen_US
dc.typeArticleen_US
dc.identifier.urlhttp://ijneam.unimap.edu.my-
dc.contributor.url140041@uotechnology.edu.iqen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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