Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/53595
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dc.contributor.authorNinet M. Ahmed-
dc.contributor.authorHassan H. Afify-
dc.contributor.authorFatma M. Ibrahim-
dc.date.accessioned2018-06-08T03:23:53Z-
dc.date.available2018-06-08T03:23:53Z-
dc.date.issued2018-04-
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol.11 (2), 2018, pages 195-210en_US
dc.identifier.issn1985-5761 (Printed)-
dc.identifier.issn1997-4434 (Online)-
dc.identifier.urihttp://dspace.unimap.edu.my:80/xmlui/handle/123456789/53595-
dc.descriptionLink to publisher's homepage at http://ijneam.unimap.edu.my/en_US
dc.description.abstractTransparent conducting for pure and incorporated aluminum cadmium oxide (CdO:Al) thin films was prepared using spray pyrolysis method at a substrate temperature of 425 oC and a spray time of 25 minutes. The effects of Al incorporation on structural, optical, and electrical properties as well as surface morphology of the prepared films were inverstigated as a function of aluminum concentration. Calculations of crystallite size, dislocation density, as well as microstrain based on XRD patterns of the samples were performed. The incorporated Al induces a significant decrease in peaks’ intensity and changes the preferred orientation. The band gap energy varies from 2.45 eV to 2.57 eV, depending on the Al concentration. Low refractive index (n) is achieved for CdO:Al samples. The sheet resistance measurements demonstrate an observable increase and decrease with Al incorporation.en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlis (UniMAP)en_US
dc.subjectCdO & CdOen_US
dc.subjectAl Thin Filmsen_US
dc.subjectStructureen_US
dc.subjectOpticalen_US
dc.subjectSheet Resistanceen_US
dc.subjectFigure of Meriten_US
dc.subjectSpray Pyrolysisen_US
dc.titleAluminum Incorporation Impacts on Some Physical Properties of Pure CdO Film Synthesized by Spray Pyrolysisen_US
dc.typeArticleen_US
dc.contributor.urlhassanafify@ymail.comen_US
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

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