Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/51428
Title: An Innovative Method for Measuring the Optical Band Gap of Oxidized Surface Layer of Aluminum Tablets based on Absorption Spectra
Authors: Kayed, Kamal
khmk2000@gmail.com
Keywords: Aluminum Oxide
Annealing
Optical Band Gap
Plasma Edge
Reflectivity Spectra
Issue Date: Jan-2018
Publisher: Universiti Malaysia Perlis (UniMAP)
Citation: International Journal of Nanoelectronics and Materials, vol.11 (1), 2018, pages 71-76
Abstract: This research highlight an innovative method for calculating the optical band gap of thin layers of aluminum oxide resulting from the surface oxidation of non‐transparent samples of aluminum. The aluminum samples were prepared using the compressing and annealing methods. Thermal heating in suitable oven was used for annealing procedures. The effects of annealing temperature on structural and optical properties of studied samples were investigated by measuring the optical band gaps and FT‐IR spectra. The results show that the annealing temperature affects the structural and optical properties of the surface layer. In addition, it was found that in the case of annealing temperature at 1000°C, the optical band gap of alumina samples was found to be 4.99 and 4.19 eV at annealing times of 2 and 4 hours respectively. On the other hand, at the temperature of 500°C, the surface has metallic properties because the area of the oxide layer is very small. This indicates that the annealing temperature has great role in determining the properties of the surface layer.
Description: Link to publisher's homepage at http://ijneam.unimap.edu.my/
URI: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/51428
ISSN: 1985-5761 (Printed)
1997-4434 (Online)
Appears in Collections:International Journal of Nanoelectronics and Materials (IJNeaM)

Files in This Item:
File Description SizeFormat 
An Innovative Method for Measuring the Optical Band Gap.pdf700.17 kBAdobe PDFView/Open


Items in UniMAP Library Digital Repository are protected by copyright, with all rights reserved, unless otherwise indicated.