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http://dspace.unimap.edu.my:80/xmlui/handle/123456789/44249
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Anthony Vincent, Darin Moreira | - |
dc.contributor.author | Bhuvenesh, Rajamony | - |
dc.date.accessioned | 2016-11-30T06:38:04Z | - |
dc.date.available | 2016-11-30T06:38:04Z | - |
dc.date.issued | 2013-09 | - |
dc.identifier.citation | Applied Mechanics and Materials, vol.421, 2013, pages 898-903 | en_US |
dc.identifier.issn | 1662-7482 | - |
dc.identifier.uri | www.scientific.net/AMM.421.898 | - |
dc.identifier.uri | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/44249 | - |
dc.description | Link to publisher's homepage at http://www.ttp.net/ | en_US |
dc.description.abstract | This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process and equipment can utilize it and get better output quality from a process and cost standpoint, which is a key driver in any manufacturing industry. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Trans Tech Publications Ltd | en_US |
dc.subject | Case study | en_US |
dc.subject | IR laser | en_US |
dc.subject | Laser mark | en_US |
dc.subject | TRIZ | en_US |
dc.subject | Maintenance algorithm | en_US |
dc.subject | Quality output | en_US |
dc.title | Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.4028/www.scientific.net/AMM.421.898 | - |
dc.contributor.url | darin.moreira.anthony.vincent@intel.com | en_US |
dc.contributor.url | bhuvenesh@unimap.edu.my | en_US |
Appears in Collections: | Bhuvenesh Rajamony, Prof. Dr. |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Algorithm to improve process robustness.pdf | 174.38 kB | Adobe PDF | View/Open |
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