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Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/34117
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dc.contributor.authorKhairudi, Mohd Juni-
dc.contributor.authorM.F., Abd Malek-
dc.contributor.authorManjur Murshed, Zahid Ahmed-
dc.contributor.authorEe Meng, Cheng, Dr.-
dc.date.accessioned2014-04-28T12:40:37Z-
dc.date.available2014-04-28T12:40:37Z-
dc.date.issued2011-
dc.identifier.citationIEEE International RF and Microwave Conference, 2011, pages 19-20en_US
dc.identifier.isbn978-1-4577-1628-7-
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/34117-
dc.descriptionLink to publisher's homepage at http://ieeexplore.ieee.org/en_US
dc.description.abstractThis paper presents Harum Manis mango maturity characterizations based on dielectric properties. Currently, Harum Manis maturity is determined by referring to number of weeks of growth and farmer experience. This paper proposes a quick and simple microwave measurement technique. An open ended dielectric probe is used to measure dielectric properties of Harum Manis mango for frequency range from 500 MHz until 20 GHz. The relationship between dielectric constant and loss factor as well as week of growth is established. These data contributes to further research of Harum Manis maturity sensor application.en_US
dc.language.isoenen_US
dc.publisherIEEE Conference Publicationsen_US
dc.subjectDielectric propertiesen_US
dc.subjectHarum Manis mangoen_US
dc.subjectMaturityen_US
dc.subjectOpen ended probeen_US
dc.titleHarum Manis mango dielectric properties based on maturityen_US
dc.typeWorking Paperen_US
dc.identifier.urlhttp://dx.doi.org/10.1109/RFM.2011.6168685-
dc.identifier.urlhttp://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6168685&tag=1-
dc.contributor.urlemcheng@unimap.edu.myen_US
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