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dc.contributor.authorSundaraj, Kenneth, Prof. Dr.-
dc.date.accessioned2014-04-08T03:06:33Z-
dc.date.available2014-04-08T03:06:33Z-
dc.date.issued2008-
dc.identifier.citationWSEAS Conferences Computing and computational techniques in sciences Conference, 2008, pages 109-115en_US
dc.identifier.isbn978-960-474-009-3-
dc.identifier.issn1790-2769-
dc.identifier.urihttp://dspace.unimap.edu.my:80/dspace/handle/123456789/33476-
dc.descriptionLink to publisher's homepage at http://www.wseas.org/en_US
dc.description.abstractAutomated visual inspection (AVI) is becoming an integral part of modern surface mount technology assembly (SMTa) process. With the increase in demand, high-volume production has to cater for both the quantity and zero defect quality assurance. A wide range of defect detecting techniques and algorithms have been reported in the past decade. In this paper, we focus on missing and misalignment defects in SMTa. Thresholding and pixel frequency summation are some of the techniques which have been used for defect detection. Here, a new approach using color background subtraction is presented to address the stated defect.en_US
dc.language.isoenen_US
dc.publisherWorld Scientific and Engineering Academy and Societyen_US
dc.subjectAutomated visual inspection (AVI)en_US
dc.subjectSurface Mount Technology assembly (SMTa)en_US
dc.subjectBackground subtractionen_US
dc.titleAutomated visual inspection for missing or misaligned components in SMT assemblyen_US
dc.typeArticleen_US
dc.identifier.urlhttp://www.wseas.us/e-library/conferences/2008/spain/selected/selected12.pdf-
dc.contributor.urlkenneth@unimap.edu.myen_US
Appears in Collections:Kenneth Sundaraj, Assoc. Prof. Dr.



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