Please use this identifier to cite or link to this item:
http://dspace.unimap.edu.my:80/xmlui/handle/123456789/32663
Title: | Structural properties of PbI₂ thin film |
Authors: | Safaa, I. Mohammed Naser, M. Ahmed Yarub, Al-Douri, Assoc. Prof. Dr. Uda, Hashim, Prof. Dr. Safaa.idan@yahoo.com nas_tiji@yahoo.com yaldouri@yahoo.com uda@unimap.edu.my |
Keywords: | PbI₂ thin film Structural properties Thermal evaporation |
Issue Date: | Jan-2014 |
Publisher: | Trans Tech Publications |
Citation: | Advanced Materials Research, vol.879, 2014, pages 175-179 |
Abstract: | Lead iodide (PbI₂) thin films were successfully prepared by thermal evaporation method on a glass substrate at room temperature. The structural analysis of these films was done by XRD. The results revealed that the crystallite size increases when increasing the film thickness and annealing temperature. In addition, the preferred growth orientation was 001 for all the samples. |
Description: | Link to publisher's homepage at http://www.ttp.net/ |
URI: | http://dspace.unimap.edu.my:80/dspace/handle/123456789/32663 |
ISSN: | 1662-8985 |
Appears in Collections: | Uda Hashim, Prof. Ts. Dr. Institute of Nano Electronic Engineering (INEE) (Articles) |
Files in This Item:
File | Description | Size | Format | |
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Structural Properties of PbI2 Thin Film.pdf | 128.66 kB | Adobe PDF | View/Open |
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