Please use this identifier to cite or link to this item:
http://dspace.unimap.edu.my:80/xmlui/handle/123456789/28650
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Darin Moreira A/L Anthony Vincent | - |
dc.contributor.author | Bhuvenesh, Prof. Dr. Rajamony | - |
dc.date.accessioned | 2013-10-08T11:34:23Z | - |
dc.date.available | 2013-10-08T11:34:23Z | - |
dc.date.issued | 2013-09 | - |
dc.identifier.citation | Applied Mechanics and Materials, vol. 421, 2013, pages 898-903 | en_US |
dc.identifier.issn | 1662-7482 | - |
dc.identifier.uri | http://www.scientific.net/AMM.421.898 | - |
dc.identifier.uri | http://dspace.unimap.edu.my/123456789/28650 | - |
dc.description | Link to publisher's homepage at http://www.ttp.net/ | en_US |
dc.description.abstract | This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process and equipment can utilize it and get better output quality from a process and cost standpoint, which is a key driver in any manufacturing industry. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Trans Tech Publications | en_US |
dc.subject | Manufacturing industry | en_US |
dc.subject | Case study | en_US |
dc.subject | IR laser | en_US |
dc.subject | Laser mark | en_US |
dc.subject | Maintenance algorithm | en_US |
dc.subject | Quality output | en_US |
dc.subject | TRIZ | en_US |
dc.title | Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment | en_US |
dc.type | Article | en_US |
dc.contributor.url | bhuvenesh@unimap.edu.my | en_US |
Appears in Collections: | School of Manufacturing Engineering (Articles) Bhuvenesh Rajamony, Prof. Dr. |
Files in This Item:
File | Description | Size | Format | |
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Algorithm to improve process robustness in the assembly.doc | 26 kB | Microsoft Word | View/Open |
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