Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/27370
Title: Effect of additives on optical measurements of NiSe2 thin films
Authors: Sahaya Anand, T. Joseph
Mohd., Zaidan
Sharizan, S.
anand@utem.edu.my
Keywords: Thin film
Additive
Photoelectrochemical
Electrodeposition
Nickel selenide
Issue Date: 20-Nov-2012
Publisher: Malaysian Technical Universities Network (MTUN)
Citation: p. 237-241
Series/Report no.: Proceedings of the Malaysian Technical Universities Conference on Engineering and Technology (MUCET) 2012
Abstract: Nickel selenide, NiSe2 is one of the absorbent materials used in thin film technology in photoelectrochemical (PEC) cell. Electrodeposition is a preferred method to produce NiSe2 thin films due to its advantages such as the possibility of large scale production, minimum waste of components, easy monitoring of deposition process and large area deposition. Ethylenediaminetetraacetic acid (EDTA) and triethanolamine (TEA) were employed as the additives during the deposition. The samples were deposited within 30 minutes deposition time according to potential acquired from cyclic voltammetry measurements. Thin film thickness measurements, structural studies, optical studies, morphological and compositional analysis as well as Mott-Schottky measurements were carried out.
Description: Malaysian Technical Universities Conference on Engineering and Technology (MUCET) 2012 organised by technical universities under the Malaysian Technical Universities Network (MTUN), 20th - 21st November 2012 at Hotel Seri Malaysia, Kangar, Perlis, Malaysia.
URI: http://dspace.unimap.edu.my/123456789/27370
Appears in Collections:Conference Papers

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