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dc.contributor.authorYarub, Al - Douri-
dc.date.accessioned2013-01-11T02:43:34Z-
dc.date.available2013-01-11T02:43:34Z-
dc.date.issued2012-
dc.identifier.citationAdvanced Materials Research, vol. 545, 2012, pages 32-37en_US
dc.identifier.issn1022-6680-
dc.identifier.urihttp://www.scientific.net/AMR.545.32-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/22939-
dc.descriptionLink to publisher's homepage at www.ttp.net/en_US
dc.description.abstractFurther study of the quantum dot potential under hydrostatic pressure for Si is presented. This potential has been calculated by means of our recent empirical model. The indirect energy gap (Γ-X) is calculated using the full potential-linearized augmented plane wave (FP-LAPW) method. The Engel-Vosko generalized gradient approximation (EV-GGA) formalism is used to optimize the corresponding potential for energetic transition and optical properties calculations of Si. The refractive index and transverse effective charge are predicted under pressure effect. The pressure effect is used to test the validity of our model. The results are compared with others and showed reasonable agreement.en_US
dc.language.isoenen_US
dc.publisherTrans Tech Publications, Switzerland.en_US
dc.subjectOptical propertiesen_US
dc.subjectPressure effecten_US
dc.subjectQuantum-doten_US
dc.titleOptical properties of Si quantum dot potential under pressure effecten_US
dc.typeArticleen_US
dc.contributor.urlyarub@unimap.edu.myen_US
Appears in Collections:Institute of Nano Electronic Engineering (INEE) (Articles)

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