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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively 117

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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively 2 7 2 4 1 3 1

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Introduction.pdf 4
Literature review.pdf 4
Conclusion.pdf 3
Methodology.pdf 3
Results and discussion.pdf 3
References and appendix.pdf 2
Abstract, Acknowledgment.pdf 1

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