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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively 124

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Electrical characterization of 0.13 µm NMOS transistor with Retrograde Well and Halo Implant Structure Respectively 3 3 0 0 5 0 0

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Introduction.pdf 5
Results and discussion.pdf 5
Conclusion.pdf 4
Literature review.pdf 4
Methodology.pdf 3
Abstract, Acknowledgment.pdf 2
References and appendix.pdf 2

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