Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/19266
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dc.contributor.authorIsmail, Ibrahim-
dc.contributor.authorZuwairie, Ibrahim-
dc.contributor.authorKamal, Khalil-
dc.contributor.authorMusa, Mohd Mokji-
dc.contributor.authorSyed Abdul Rahman, Syed Abu Bakar-
dc.contributor.authorNorrima, Mokhtar-
dc.contributor.authorWan Khairunizam, Wan Ahmad-
dc.date.accessioned2012-05-16T04:02:32Z-
dc.date.available2012-05-16T04:02:32Z-
dc.date.issued2012-05-
dc.identifier.citationInternational Journal of Innovative Computing, Information and Control, vol. 8 5(A), 2012, pages 3239-3250en_US
dc.identifier.issn1349-4198-
dc.identifier.urihttp://www.ijicic.org/10-11079-1.pdf-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/19266-
dc.descriptionLink to publisher's homepage at http://www.ijicic.org/en_US
dc.description.abstractBecause decisions made by human inspectors often involve subjective judg- ment, in addition to being intensive and therefore costly, an automated approach for printed circuit board (PCB) inspection is preferred to eliminate subjective discrimination and thus provide fast, quantitative, and dimensional assessments. In this study, defect classi cation is essential to the identi cation of defect sources. Therefore, an algorithm for PCB defect classi cation is presented that consists of well-known conventional op- erations, including image difference, image subtraction, image addition, counted image comparator, ood- ll, and labeling for the classi cation of six different defects, namely, missing hole, pinhole, underetch, short-circuit, open-circuit, and mousebite. The de- fect classi cation algorithm is improved by incorporating proper image registration and thresholding techniques to solve the alignment and uneven illumination problem. The improved PCB defect classi cation algorithm has been applied to real PCB images to successfully classify all of the defects.en_US
dc.language.isoenen_US
dc.publisherICIC Internationalen_US
dc.subjectPrinted circuit boardsen_US
dc.subjectDefect classificationen_US
dc.subjectDefect detectionen_US
dc.titleAn improved defect classification algorithm for six printing defects and its implementation on real printed circuit board imagesen_US
dc.typeArticleen_US
dc.contributor.urltsuri inc@hotmail.comen_US
dc.contributor.urlkhairunizam@unimap.edu.myen_US
Appears in Collections:School of Mechatronic Engineering (Articles)
Ismail Ibrahim
Wan Khairunizam Wan Ahmad, Assoc. Prof. Ir. Ts. Dr.

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