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dc.contributor.authorTh Sabar, Dhahi-
dc.contributor.authorUda, Hashim, Prof. Dr.-
dc.contributor.authorN. M., Ahmed-
dc.contributor.authorMd Eaqub, Ali-
dc.date.accessioned2012-04-22T02:02:01Z-
dc.date.available2012-04-22T02:02:01Z-
dc.date.issued2010-12-01-
dc.identifier.citationp. 277-282en_US
dc.identifier.isbn978-0-7354-0897-5-
dc.identifier.issn0094-243X-
dc.identifier.urihttp://proceedings.aip.org/resource/2/apcpcs/1341/1/277_1?isAuthorized=no-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/18887-
dc.descriptionLink to publisher's homepage at http://proceedings.aip.org/en_US
dc.description.abstractThe development and application of micro gap for electrochemical sensors and biomolecule detection are reviewed in this article. The preparation methods for micro- and nano-gaps and their properties are discussed along with their advantages in electrochemical sensors and biomolecule detection. Biology and medicine have seen great advances in biosensors and biochips capable of characterizing and quantifying electrochemical sensor. To understand the important relationship between sensibility and nano structure, we introduce the fabrication and characterization of micro- and nano-gap structures for electrochemical sensor. In this paper, two mask designs are proposed. The first is the lateral micro- and nano-gap with aluminum (Al) electrode, and the second mask is for pad Al electrode pattern. Lateral micro-gaps are introduced in the fabrication process using amorphous silicon (a-Si) and Al as an electrode. Conventional ultraviolet lithography technique and dry etching for a-Si layer with wet etching for Al surface processes are used to fabricate the micro- and nano-gaps based on the standard complementary metal-oxide-semiconductor technology and characterization of its conductivity. Electrical characterization is applied using Semiconductor Parameter Analyzer, Spectrum Analyzer, current-voltage (IV)-capacitance-voltage (CV) station for electrical characteristics. Conductivity, resistance, and capacitance tests are performed to characterize and verify the structure of the device, resulting in a small micro-gap as revealed by a further IV curve result showing a current in nano amps. The characteristics of the fabricated gap are close to those of a micro-gap, as verified by the literature.en_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofseriesProceedings of the International Conference on Enabling Science and Nanotechnology (EsciNano) 2010en_US
dc.subjectCapacitance-Voltage Measurementen_US
dc.subjectConductivityen_US
dc.subjectMicro and Nano-Gapen_US
dc.subjectUV Lithographyen_US
dc.titleFabrication and characterization of a-Si micro and nano-gap structure for electrochemical sensoren_US
dc.typeWorking Paperen_US
Appears in Collections:Conference Papers
Uda Hashim, Prof. Ts. Dr.



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