Please use this identifier to cite or link to this item: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/13269
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dc.contributor.authorY., Al-Douri-
dc.contributor.authorN.M., Ahmed-
dc.contributor.authorN., Bouarissa-
dc.contributor.authorA, Bouhemadou-
dc.date.accessioned2011-07-20T07:42:19Z-
dc.date.available2011-07-20T07:42:19Z-
dc.date.issued2011-08-
dc.identifier.citationMaterials and Design, Vol. 32(7), August 2011, pages 4088-4093en_US
dc.identifier.issn0261-3069-
dc.identifier.urihttp://www.elsevier.com/wps/find/homepage.cws_home-
dc.identifier.urihttp://www.sciencedirect.com/science/article/pii/S026130691100166X-
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/13269-
dc.descriptionLink at publisher's homepage at http://www.elsevier.comen_US
dc.description.abstractCompatibility between experimental and theoretical works is achieved. Empirical Pseudopotential Method (EPM) is used to calculate the energy gap of Si which is found to be indirect. Features such as refractive index, optical dielectric constant, bulk modulus, elastic constants and short-range force constants have been investigated. In addition to the shear modulus, Young's modulus, Poisson's ratio and Lame's constants for both bulk Si (p = 0%) and Porous silicon (PS) are derived. The calculated results are found to be in good agreement with other experimental and theoretical ones. Also, the Debye temperature of PS is estimated from the average sound velocity. To our knowledge, the optical properties using specific models and elasticity of PS are reported for the first time.en_US
dc.language.isoenen_US
dc.publisherElsevier Ltd.en_US
dc.subjectInvestigated opticalen_US
dc.subjectPorous siliconen_US
dc.subjectEmpirical Pseudopotential Method (EPM)en_US
dc.subjectElastic propertiesen_US
dc.titleInvestigated optical and elastic properties of Porous silicon: Theoretical studyen_US
dc.typeArticleen_US
Appears in Collections:Institute of Nano Electronic Engineering (INEE) (Articles)

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