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|---|---|
| Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device | 233 |
Total Visits per Month
| January 2024 | February 2024 | March 2024 | April 2024 | May 2024 | June 2024 | July 2024 | |
|---|---|---|---|---|---|---|---|
| Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device | 7 | 2 | 4 | 6 | 2 | 12 | 6 |
File Downloads
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|---|---|
| Abstract, Acknowledgment.pdf | 245 |
| Literature review.pdf | 5 |
| Results and discussion.pdf | 2 |
| Conclusion.pdf | 1 |
| Introduction.pdf | 1 |
| Methodology.pdf | 1 |
| References and appendix.pdf | 1 |
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