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Browsing by Author Norain Mohd Saad
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| Mar-2007 | Gate Oxide Integrity (GOI) Characterization For Deep Submicron CMOS Device | Norain Mohd Saad; Ramzan Mat Ayub (Advisor) |