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Browsing by Author Chong, Leong Gan
Showing results 1 to 6 of 6
Issue Date | Title | Author(s) |
Jun-2013 | Extended reliability of gold and copper ball bonds in microelectronic packaging | Chong, Leong Gan; Classe, Francis; Bak, Lee Chan; Uda, Hashim, Prof. Dr.; chong-leong.gan@spansion.com; uda@unimap.edu.my |
Oct-2014 | Influence of shear strength on long term biased humidity reliability of Cu ball bonds | Chong, Leong Gan; Uda, Hashim, Prof. Dr.; clgan_pgg@yahoo.com; uda@unimap.edu.my |
2013 | Reliability assessment and activation energy study of au and pd-coated cu wires post high temperature aging in nanoscale semiconductor packaging | Chong, Leong Gan; Uda, Hashim, Prof. Dr.; chong-leong.gan@spansion.com; clgan_pgg@yahoo.com; uda@unimap.edu.my |
Aug-2013 | Reliability assessment and mechanical characterization of Cu and Au ball bonds in BGA package | Chong, Leong Gan; Uda; chong-leong.gan@spansion.com; clgan_pgg@yahoo.com; uda@unimap.edu.my |
2013 | Superior performance and reliability of copper wire ball bonding in laminate substrate based ball grid array | Chong, Leong Gan; Classe, Francis; Uda, Hashim, Prof. Dr.; uda@unimap.edu.my; chong-leong.gan@spansion.com |
2013 | Wearout reliability and intermetallic compound diffusion kinetics of Au and PdCu wires used in nanoscale device packaging | Chong, Leong Gan; E., K. Ng; Bak, Lee Chan; Classe, Francis; Kwuanjai, T.; Uda, Hashim, Prof. Dr.; clgan_pgg@yahoo.com; mflim@yahoo.com; gchongleong@gmail.com; chong-leong.gan@spansion.com; uda@unimap.edu.my |