Browsing by Author Ali Yeon, Mohd Shakaff, Prof. Dr.
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Issue Date | Title | Author(s) |
---|---|---|
2009 | High degree of testability using full scan chain and ATPG-An industrial perspective | Mamun, Ibne Reaz; Lee, W. F.; Hamid, N. H.; Lo, H. H.; Ali Yeon, Mohd Shakaff, Prof. Dr. |