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dc.contributor.authorZul Azhar, Zahid Jamal, Prof. Dr.
dc.date.accessioned2010-04-12T05:06:41Z
dc.date.available2010-04-12T05:06:41Z
dc.date.issued2010-04
dc.identifier.citationp.1-31en_US
dc.identifier.isbn978-967-5415-10-4
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/7897
dc.description.abstractTransmission electron microscopy (TEM) is an unrivalled technique for observing, characterizing and analyzing almost any type of materials. In physical science, the first observations of defects (i.e. dislocations) by TEM were published in the 1950s. Since then the technique has been developed into an indispensable tool for materials scientists, not only for the characterization of extended defect structures of materials, but also for the understanding of the mechanisms that control their properties. In this Professorial Lecture publication, a snapshot on the tremendous power and versatility of this technique is discussed. In addition to the basics and fundamentals of TEM, related research works on the characterization of defects in semiconducting epitaxial layers that I had pioneered and contributed to, namely on the development of large‐area TEM specimen preparation techniques, the characterization of the diamond‐shape defects, and the study of dopant diffusivity via TEM, are presented.en_US
dc.language.isoenen_US
dc.publisherPenerbit Universiti Malaysia Perlisen_US
dc.relation.ispartofseries5th Professorial Lecture Seriesen_US
dc.subjectUniMAP -- Publicationsen_US
dc.subjectUniMAP -- Syarahan Umum Profesoren_US
dc.subjectUniMAP -- Academicen_US
dc.subjectTransmission electron microscopyen_US
dc.titleUnderstanding the small world: an insight into the application of transmission electron microscopy in characterizing epitaxial layersen_US
dc.typeBooken_US
dc.publisher.departmentSchool of Microelectronic Engineeringen_US


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