| dc.contributor.author | Universiti Malaysia Perlis (UniMAP) | |
| dc.date | 2023-05 | |
| dc.date.accessioned | 2023-05-11T01:32:17Z | |
| dc.date.available | 2023-05-11T01:32:17Z | |
| dc.date.issued | 2023-02 | |
| dc.identifier.citation | 7 p. | en_US |
| dc.identifier.uri | http://dspace.unimap.edu.my:80/xmlui/handle/123456789/78708 | |
| dc.language.iso | en | en_US |
| dc.publisher | Universiti Malaysia Perlis (UniMAP) | en_US |
| dc.relation.ispartofseries | NMJ 30803;Semester 1 2022/2023 | |
| dc.subject.other | Examination paper | en_US |
| dc.subject.other | NMJ 30803 -- Test | en_US |
| dc.subject.other | Reliability and Testability in Integrated Circuit Design -- Examination paper | en_US |
| dc.subject.other | Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir -- Examination paper | en_US |
| dc.title | Reliability and Testability in Integrated Circuit Design | en_US |
| dc.title.alternative | Ketahanan dan Kebolehujian dalam Rekabentuk Litar Terkamir | en_US |
| dc.type | Other | en_US |
