Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment

dc.contributor.author	Anthony Vincent, Darin Moreira
dc.contributor.author	Bhuvenesh, Rajamony
dc.date.accessioned	2016-11-30T06:38:04Z
dc.date.available	2016-11-30T06:38:04Z
dc.date.issued	2013-09
dc.identifier.citation	Applied Mechanics and Materials, vol.421, 2013, pages 898-903	en_US
dc.identifier.issn	1662-7482
dc.identifier.uri	www.scientific.net/AMM.421.898
dc.identifier.uri	http://dspace.unimap.edu.my:80/xmlui/handle/123456789/44249
dc.description	Link to publisher's homepage at http://www.ttp.net/	en_US
dc.description.abstract	This document explains and demonstrates the generic improvement algorithm created to enhance the maintenance methodology in the semiconductor manufacturing environment. The use of this algorithm demonstrates how a process and equipment can utilize it and get better output quality from a process and cost standpoint, which is a key driver in any manufacturing industry.	en_US
dc.language.iso	en	en_US
dc.publisher	Trans Tech Publications Ltd	en_US
dc.subject	Case study	en_US
dc.subject	IR laser	en_US
dc.subject	Laser mark	en_US
dc.subject	TRIZ	en_US
dc.subject	Maintenance algorithm	en_US
dc.subject	Quality output	en_US
dc.title	Algorithm to improve process robustness in the assembly & test manufacturing industry a case study of the 1064nm wavelength laser mark equipment	en_US
dc.type	Article	en_US
dc.identifier.doi	10.4028/www.scientific.net/AMM.421.898
dc.contributor.url	darin.moreira.anthony.vincent@intel.com	en_US
dc.contributor.url	bhuvenesh@unimap.edu.my	en_US