Annealing effects on opto-electronic properties of Ag₂O films growth using thermal evaporation techniques

Abstract

High quality transparent conductive silver oxide (Ag₂O) nanocrystals thin films were prepared successfully using thermal evaporation method using pure Ag metal, followed by Oxidation process under two different oxidation temperature. Optical properties show high transparency of about 70% and decrease to 55 % at lower oxidation temperature . Optical band gab of prepared film at optimum condition is about 2.88 and 2.92 eV. Surface morphology measured using AFM give a triangle like structure with average roughness of (2.65 nm). The X-ray diffraction insures the formation of polycrystalline silver oxide nanostructure thin film.