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dc.contributor.authorLiu, W.
dc.contributor.authorZhang, D. H.
dc.contributor.authorLoh, T. H.
dc.contributor.authorYoon, S. F.
dc.contributor.authorBalasubramanian, N.
dc.date.accessioned2008-10-10T03:38:02Z
dc.date.available2008-10-10T03:38:02Z
dc.date.issued2008
dc.identifier.citationInternational Journal of Nanoelectronics and Materials, vol. 1 (1), 2008, pages 53-64.en_US
dc.identifier.issn1985-5761 (Printed)
dc.identifier.issn1997-4434 (Online)
dc.identifier.urihttp://www.unimap.edu.my
dc.identifier.urihttp://dspace.unimap.edu.my/123456789/2371
dc.descriptionLink to publisher's homepage at http://www.unimap.edu.my/ ; Open access only applicable for vol. 1; issue 1, 2008.en_US
dc.description.abstractOptical intersubband transitions (ISTs) for both in-plane polarization (TE) and normalto- plane polarization (TM) in p-type Si1-xGex/Si multiple quantum wells (MQWs) are investigated using 14-band k⋅p model combined with the envelope-function Fourier expansion method. The results show that the amplitudes of different intersubband transitions for TE and TM polarizations, and the overall absorption vary regularly with the well width as it affects the distribution of bound and continuum excited states directly, and TE mode absorption dominates in all the QWs studied. This work provides useful information for design and analysis of Si1-xGex/Si quantum well infrared photodetectors (QWIPs).en_US
dc.language.isoenen_US
dc.publisherUniversiti Malaysia Perlisen_US
dc.subjectSemiconductorsen_US
dc.subjectQuantum electronicsen_US
dc.subjectQuantum wellsen_US
dc.subjectOptoelectronic devicesen_US
dc.subjectMultiple quantum wellsen_US
dc.titleStudy of intersubband transitions in Si1-xGex/Si quantum wells using 14-band k⋅p modelen_US
dc.typeArticleen_US


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