Browsing International Journal of Nanoelectronics and Materials (IJNeaM) by Subject "Radiation -- Measurement"
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Studying the different effects of gamma and x-ray irradiation on the electrical properties of silicon diode type 1N1405
(Universiti Malaysia Perlis, 2009)The silicon diode types 1N1405 subjected to different types of radiation like (x-ray and y-radiation), it is measured by the foward and reverse bias voltage before and after irradiation, so this research study the different ...