Browsing School of Materials Engineering (Articles) by Subject "Scanning electron microscope (SEM)"
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Microstructure evolution of Sn-3.5Ag-1.0Cu-0.5Ni/Cu system lead free solder under long term thermal aging
(Scientific.Net, 2012-12)Due to environmental concerns, lead-free solders were introduced in replacing the lead-based solders in microelectronics devices technology. Although there are many lead-free solder available, the Sn-Ag-Cu solder was ...